Kenneth Beyerlein

  • PostDoc



Condensed Matter Department,
Max Planck Institute for the Structure and Dynamics of Matter, CFEL

Bldg. 99, Rm. O2.059
Luruper Chaussee 149
22761 Hamburg, Germany

Phone: +49-(0)40-8998-5787

Short bio

Ken received a BS in Physics from the University of Michigan in 2006, and a dual-PhD in Materials Science and Engineering from the Georgia Institute of Technology and the University of Trento, Italy in 2011. During his PhD, Ken combined powder X-ray diffraction line profile analysis and molecular dynamics atomic simulations to study the structure of catalytic metal nanoparticles. In 2012, he joined the group of Prof. Henry Chapman at the Center of Free-Electron Laser Science, where he developed instrumentation, data analysis and novel structure determination methods for XFEL serial crystallography experiments. He joined the Cavalleri group in 2017 and will focus on studying structural dynamics in strongly coupled electronic materials.

Research Interests

  • Nonlinear phononics
  • Non-equilibrium dynamics
  • X-ray crystallography
  • Coherent X-ray imaging

Selected publications

Multiple supersonic phase fronts launched at a complex-oxide hetero-interface
M. Först, K.R. Beyerlein, R. Mankowsky, W. Hu, G. Mattoni, S. Catalano, M. Gibert, O. Yefanov, J.N. Clark, A. Frano, J.M. Glownia, M. Chollet, H. Lemke, B. Moser, S.P. Collins, S.S. Dhesi, A.D. Caviglia, J.-M. Triscone, and A. Cavalleri
Physical Review Letters, 118, 027401 (2017)  
Direct Phasing of Finite Crystals Illuminated with a Free-Electron Laser
R.A. Kirian, R.J. Bean, K. R. Beyerlein, M. Barthelmess, C.H. Yoon, F. Wang, F. Capotondi, E. Pedersoli, A. Barty, H.N. Chapman
Physical Review X, 5 (1) 011015 (2015)  
Serial time-resolved crystallography of photosystem II using a femtosecond X-ray laser
C. Kupitz, S. Basu, [......], S. Boutet, R.B. Doak, U. Weierstall, M. Frank, H.N. Chapman, J.C. H. Spence, P. Fromme
Nature 513, 261-265 (2014)  
Characterization of (111) Surface Tailored Pt Nanoparticles by Electrochemistry and X-ray Powder Diffraction
K.R. Beyerlein, J. Solla-Gullón, E. Herrero, E. Garnier, F. Pailloux, M. Leoni, P. Scardi, R.L. Snyder, A. Aldaz, J.M. Feliu
Materials Science and Engineering A, 528, 83-90 (2010)